MIL-STD-750
Test Methods for Semiconductor Devices.
FSC: 5961
This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems The methods and procedures in the various parts of this standard cover basic environmental, physical, and electrical tests to determine resistance to deleterious effects of natural elements and conditions surrounding military and space operations. For the purpose of this standard, the term "devices" includes such items as transistors, diodes, voltage regulators, rectifiers, tunnel diodes, and other related parts. This standard is intended to apply only to semiconductor devices.
Points of Contact:
MIL-STD-750 Group
Phone: 614-692-YYYY
Email: 750.TestMethods@dla.mil
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Document Downloads
Test Methods for Semiconductor Devices.
Revision: F, Dated: 01 April 2021
File Name: std750.pdf, File Size: 851 kb
Mechanical Test Methods For Semiconductor Devices, Part 1: Test Methods 1000 Through 1999
Dated: 18 April 2023
File name: std750part1.pdf, File Size: 2490 kb
Mechanical Test Methods for Semiconductor Devices Part 2: Test Methods 2001 through 2999
Dated: 08 April 2026
File name: std750part2.pdf, File Size: 16286 kb
Transistor Electrical Test Methods for Semiconductor Devices Part 3: Test Methods 3000 through 3999
Dated: 29 May 2026
File name: std750part3.pdf, File Size: 8015 kb
Diode Electrical Test Methods for Semiconductor Devices Part 4: Test Methods 4000 through 4999
Dated: 26 March 2026
File name: std750part4.pdf, File Size: 5006 kb
High Reliability Space Application Test Methods for Semiconductor Devices Part 5: Test Methods 5000 through 5999
Dated: 10 August 2018
File name: std750part5.pdf, File Size: 260 kb
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